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IEC group > Technological & Scientific Equipment
Electrochemical microscopy laboratory
ATOMIC FORCE MICROSCOPE
Within the 2018 call for grants for infrastructure and equipment for R & D & I for the period 2018-2020 (PO FEDER Comunitat Valenciana 2014-2020), the following scientific-technological equipment for the characterization and degradation of organic pollutants has been acquired (co-financed by the European Regional Development Fund FEDER and the Generalitat Valenciana with reference IDIFEDER / 2018/044):
Atomic Force Microscope, AFM-Raman-Confocal. Attachment of an Atomic Force Microscope to an existing Raman Confocal Laser Microscope.
The microscopy technique known as AFM (Atomic Force Microscope) is based on the interaction of an extremely thin tip capable of monitoring the surface of a sample. This monitoring is carried out by recording the interaction between the tip and the sample, obtaining a three-dimensional image of the surface, being able to study its surface properties. The interaction recorded corresponds to the interatomic and intermolecular forces, providing information on the three-dimensional topography of the sample (size, shape and periodicity of details, surface roughness).
The AFM technique is a powerful technique, which, associated with Raman spectroscopy, allows obtaining greater spatial information from the sample. In this sense, the compatibility of the AFM and Raman Confocal Laser Microscopy techniques provides, the acquisition of Raman images together with the qualitative-quantitative analysis of the surface products linked to the topographic information provided by the AFM. The results obtained by these two techniques for different nanostructures may be related to the electrochemical properties of these samples, which could be applied to different fields of studies, such as the degradation of organic pollutants in solution.
 
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